Phenom GSR Scanning Electron Microscope for automated gunshot residue analysis

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Gunshot residue (GSR) analysis is an important part of forensic investigations to determine if a firearm has been used in a crime. Whenever a gun is fired, particles from the bullet, propellant, gun and primer are deposited on objects in the immediate vicinity of the weapon (eg, on the shooter’s hand, clothes, etc). These particles range in size and are primarily composed of lead, barium and antimony and possibly lead-free primers containing titanium and zinc.

The Phenom GSR Scanning Electron Microscope (SEM) is a vital tool in crime labs for gathering forensic evidence. The user can quickly search for GSR particles automatically and characterise and classify them using energy dispersive spectroscopy (EDS) analysis. The back scatter detector enables evidence of GSR to be quickly realised with atomically heavier elements appearing brighter compared to other particles such as dust, dirt, fibres, flakes of skin, etc. Further details of surface morphology can be examined using the optional secondary electron detector.

The Phenom GSR is based on the Phenom XL desktop SEM. Both software and hardware are fully integrated to enhance user-friendliness and analysis speed. The Phenom XL does not require any special facilities and is easy to set up and transport. It can also be used for many other forensics applications, such as ballistics, paint analysis, fibre characterisation, etc.

Other features include: a fully motorised stage; fast time from loading sample to SEM image (<1 min); fully integrated X-ray analysis (EDS) for element ID; large sample size (up to 100 mm); ‘never lost’ navigation; a voltage range of 4.8 to 20.5 kV; and conformity to ASTM standards.