Hitachi FlexSEM 1000 variable-pressure scanning electron microscope

The FlexSEM 1000 VP-SEM is a compact system (450 mm wide) that delivers the performance of a conventional SEM in a lab-friendly footprint and requires only a standard wall outlet for power. The electron optical column enables high-quality imaging of specimen surfaces at low accelerating voltages, while the ultravariable-pressure detector (UVD) allows the use of low vacuum conditions to minimise charge build-up.

The user-friendly GUI and ultrafast AFC (auto focus control) and ABCC (auto brightness and contrast control) algorithms, which take only 5 s, enable optimised imaging performance with minimal time and effort. The SEM MAP function makes traversing across an entire specimen effortless. Users can navigate their samples with the use of an optical camera and deliver correlated optical and SEM images using only one click.