CIM 2015: International Congress of Metrology

The 17th International Congress of Metrology is where industry meets science to discover measurement technologies, explore industrial challenges and uncover the latest innovations. Attendees will discover state-of-the-art technologies in measurement, explore industrial challenges and uncover the latest innovations for increased performance through a varied program and roundtable sessions, an exhibition showcasing solutions and technical site visits.

The conference aims to explore the most recent developments in measurement techniques and their application for industry; and realise the added value of measurement as a quality assurance function for products and processes. The themes of the conference are:

• Control of measurement, analysis and testing processes
• Physical and chemical measurements
• Regulation, legal metrology, international recognition
• New metrology and new sectors

The call for papers ends on 15 December.