Phenom desktop SEM with X-ray for element ID
The Phenom desktop SEM is a user-friendly tool that bridges the gap between optical and ultrahigh-resolution microscopes. The desktop SEM is said to exceed the resolution of optical microscopes and eliminate the delay and difficulty associated with operating a traditional SEM.
The desktop SEM system with integrated X-ray analysis enables both sample structures to be physically examined and their elemental composition determined. Benefits include: imaging power up to 100,000x magnification; intuitive system control; fully integrated X-ray analysis; <30 s from loading sample to SEM image using an integrated X, Y motor stage; optical navigation camera and low-magnification SEM imaging for navigation.
The Phenom Pro suite software includes integrated ParticleMetric, Fibermetric, 3D Roughness and Elemental mapping applications that allow users to gather morphology and particle size data and to generate three-dimensional images while revealing the distribution of elements within the sample.
Applications include forensic investigation, material characterisation, metallurgy analysis, process control, pharmaceutical and industrial research, and more.
Phone: 02 9541 3500
Yokogawa CQ1 benchtop high-throughput 3D confocal imager
The Yokogawa CQ1 benchtop high-throughput 3D confocal imager enables 3D imaging and...
Luxendo InVi SPIM Lattice Pro light sheet microscope for live cell imaging
The Luxendo InVi SPIM Lattice Pro light sheet microscope provides a high level of flexibility for...
Jenoptik ProgRes GRYPHAX NAOS 20 MP colour microscopy camera
Specimens can be displayed with up to 30 fps at 5 MP and captured with up to 20 MP resolution....