Cartesian geometry EDXRF

Thursday, 17 September, 2009 | Supplied by: AXT Pty Ltd

Rigaku has introduced a benchtop energy dispersive X-ray fluorescence (EDXRF) spectrometer, the Rigaku NEX CG, that delivers rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types with minimal standards.

The NEX CG can non-destructively analyse elements from 11Na to 92U in solids, liquids, powders and thin films. Employing polarised excitation for lower detection limits and software for reduced standards requirements, the instrument provides part-per-billion (ppb) level detection limits for aqueous samples when used with the UltraCarry sample holder. A simplified user interface, EZ Analysis, allows for routine operation by non-technical personnel.

Unlike conventional EDXRF analysers, the NEX CG was engineered with a close-coupled Cartesian Geometry (CG) optical kernel that is claimed will increase signal-to-noise. By using secondary target excitation, instead of convention direct excitation, sensitivity is further improved. The resulting reduction in background noise and simultaneous increase in element peaks result in a spectrometer capable of routine trace element analysis - even in difficult sample types.

NEX CG is powered by a qualitative and quantitative analytical software, RPF-SQX, that features Rigaku Profile Fitting (RPF) technology. The software allows semi-quantitative analysis of almost all sample types without standards - and rigorous quantitative analysis with standards. Especially well suited to the semi-quantitative determination of elemental content in complete unknowns, the analytical power, flexibility and ease of use of the NEX CG add to its broad appeal for research, industrial and in-plant monitoring applications.

Phone: 02 9450 1359
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