DENSsolutions in situ TEM systems

DENSsolutions in situ TEM systems are now available in Australia and New Zealand. The systems utilise MEMS-based technology, effectively converting the user’s conventional TEM from a static imaging system into a powerful multifunctional nanolaboratory.

The in situ systems enable the real-time study of sample dynamics under thermal, electrical, gas and liquid stimuli. Applications include reaching an elevated temperature of >1300°C in a stable and controlled environment to observe phase transformations or precipitation growth in real time.

CLEM technologies have changed optical and scanning electron microscopy by allowing researchers to quickly and easily marry the two technologies together, gaining additional information about their samples. Similarly, adding additional modalities to a TEM enables users to accelerate their research and speed up their workflow.

With TEM sample preparation being a time-consuming undertaking, conventional TEM requires multiple samples to be produced and investigated before and after a stimulus is applied to the sample. Using DENSsolutions’ in situ TEM systems, all sample dynamic information can be captured with a single sample, in a single TEM experiment.

The systems allow users to apply heat, bias, gas and liquid to the sample environment. This enables users to observe how their specimens behave in the real-world working or native environment. The systems are suited to a range of applications, including high-temperature alloys, semiconductor materials for failure analysis and biological specimens kept in their native state.

The systems can be installed into existing TEMs.