JEOL CRYO ARM 300 II (JEM-3300) cold field emission cryo-electron microscope

JEOL has announced the release of a cold field emission cryo-electron microscope (cryo-EM), the CRYO ARM 300 II (JEM-3300), that makes it quick and easy to obtain high-contrast and high-resolution images.

The improvement of resolution in single particle analysis (SPA) using cryo-EM has led to SPA as an essential method for structural analysis of proteins. To address this market, JEOL released the CRYO ARM 300 in 2017. Equipped with a cold field emission gun (Cold FEG) for enhanced resolution and a cryo-stage for loading multiple samples, the product achieved high resolution for SPA.

However, SPA using cryo-EM needs multiple electron microscopes because the workflows for sample screening and for image data acquisition are independent of one another. Since multiple microscopes must be used, it is inconvenient to transfer cryo-samples between the cryo-Ems; users have therefore been requesting one cryo-EM enabling the complete workflow from sample screening to image data acquisition. Furthermore, an improvement of usability has been required, allowing anyone from novices to professionals to smoothly operate the microscope.

The CRYO ARM 300 II was developed in order to meet these requests, offering an improvement in throughput for high-quality data acquisition with quick and easy operation compared with the CRYO ARM 300. It is said to provide high-speed imaging achieved by optimal electron beam control; improved hardware stability for high-quality image acquisition; and higher operability through system improvement.