Nanosurf NaioAFM atomic force microscope for nano-education

The NaioAFM, by Nanosurf, is a suitable atomic force microscope for nano-education and basic research on small samples. The all-in-one AFM system provides solid performance and easy handling, with a compact footprint to boot.

The system consists of only the scan head mounted on a small vibration isolation platform with integrated controller. It takes only a few minutes to set up and prepare for a measurement. Suitable for a university course or classroom setting, the AFM is robustly designed and insensitive to careless handling by novice users yet performs well on a large variety of samples. Other features include an integrated high-resolution camera for top and side view observation, compact integrated controller, XY table, airflow shielding and vibration isolation.

The product features a versatile selection of measurement modes, despite its basic design. It is capable of measuring in all standard operating modes, and it can even perform basic electrical characterisation and basic force spectroscopy. It is particularly suitable for those who are learning AFM or who require only basic AFM functionality for their research.

The product is easy to use, taking only 10 min to learn. With built-in handling support like the cantilever alignment chip, the user doesn’t even need perfectly steady hands to set up the AFM for measurement. It doesn’t even require laser alignment — just connect everything, place a cantilever and the sample, and the first results will be ready in minutes. There is no system set-up needed — just plug it into the PC, power up and start the software.