Tescan and WITec Raman Imaging Scanning Electron (RISE) Microscopy system

Tescan Orsay Holding and WITec have launched RISE Microscopy - a correlative microscopy technique which combines confocal Raman imaging and scanning electron (RISE) microscopy within one integrated microscope system. Electron microscopy is a suitable technique for visualising the sample surface structures in the nanometre range, while confocal Raman imaging is used for the detection of the chemical and molecular components of a sample.

The microscope enables the acquisition of SEM and Raman images from the same sample area and the correlation of ultrastructural and chemical information with one microscope system. It can generate 2D and 3D images and depth profiles to visualise the distribution of the molecular compounds within a sample.

Both analytical methods are fully integrated into the microscope. Between the different measurements, a precise scan stage automatically transfers the sample inside the microscope’s vacuum chamber and repositions it. The integrated RISE software carries out the required parameter adjustments and instrument alignments. The acquired results can then be correlated and the Raman and SEM images overlaid.

The microscope provides all functions and features of a stand-alone SEM and a confocal Raman microscope. Both SEM and Raman are high-resolution imaging techniques with sub-nanometre and diffraction-limited 200-300 nanometre resolution, respectively. In Raman imaging mode, the sample can be scanned through a range of 250 x 250 x 250 µm. The product is suited to a large variety of applications such as nanotechnology, materials science and life science.