Thermo Scientific Helios 5 Plasma Focused Ion Beam (PFIB) DualBeam FIB-SEM

Thermo Fisher Scientific has released the Thermo Scientific Helios 5 Plasma Focused Ion Beam (PFIB) DualBeam focused ion beam scanning electron microscope (FIB-SEM). Built for a wide range of uses, from metals and battery characterisation to structural biology, the instrument is suitable for labs that conduct both materials and life science research.

Compared to the previous generation, the Helios 5 PFIB is said to offer high-throughput, high-quality characterisation with faster, easier and more precise sample preparation and higher-quality subsurface and 3D analysis for a wide range of materials and biological samples. The instrument allows materials scientists to discover and design new materials and analyse their structures and properties. Ease of use and advanced automation enable users with limited experience to obtain expert-level results.

A xenon plasma FIB-SEM, the product helps scientists achieve consistent, repeatable results on a broad range of applications such as sample preparation, subsurface and 3D characterisation. Its automation capabilities allow scientists to run time-consuming tasks, such as 3D analysis, overnight and on weekends. Doing this frees the instrument for other uses during standard work hours, like sample preparation or in-situ experimentation.

Additionally, the low-energy 500 V polishing minimises damage caused by milling to produce high-quality samples for a broad range of materials requiring high-resolution TEM characterisation. Gallium-free processing makes it possible to prepare high-quality TEM samples of aluminium alloys or Ga-containing materials without contamination.