WITec-ZEISS hybrid system for correlative RISE microscopy

The WITec RISE microscopy mode for correlative Raman-SEM imaging is now compatible with the scanning electron microscope ZEISS MERLIN. The hybrid system enables users to benefit from high-quality and sophisticated system components for research in the fields of nanotechnology, life sciences, geosciences, pharmaceutics, materials research and more.

Correlative microscopy involves using two or more microscopy techniques. RISE correlative microscopy combines a confocal Raman imaging and scanning electron (RISE) microscope in a single system. Raman microscopy, as a label-free, non-destructive technology for the identification and imaging of the molecular composition of a sample, serves to complement SEM (scanning electron microscopy), which visualises the surface structure of a sample, and the often-associated EDX (energy-dispersive X-ray spectroscopy) that can only identify elemental constituents.

The integration of both techniques into one system improves ease of use and accelerates the experimental workflow. It places both the objective and sample stage required for Raman microscopy within the SEM’s vacuum chamber. Thus, the sample can remain under vacuum for both measurements and is simply transferred between the Raman and SEM measuring positions by a software-driven, push-button mechanism using a precise scan stage.

The combined system provides all functions and features of a standalone ZEISS SEM and a WITec confocal Raman microscope. In Raman imaging mode the sample can be scanned through a range of 250 x 250 x 250 µm³. The microscope enables software-driven quick and convenient switching between Raman imaging and SEM, transformation of the Raman spectra into an image and the ability to overlay both images to produce the RISE image. RISE microscopy pairs ease of use with good analytical power.