Shimadzu SPM-9700 scanning probe microscope
The SPM-9700 scanning probe microscope features software that facilitates easy operation and data analysis, while providing high-quality data.
Scanning probe microscopes (SPM) are used to observe the three-dimensional image of sample surfaces at high magnifications by scanning the sample surface with an extremely sharp probe. They allow observing the surfaces of metals, semiconductors, ceramics, organic matter, biological organisms and other samples at high magnifications, ranging from a few 1000 times to a few million times magnification, without pretreating the surfaces. They also offer good vertical resolution, in the direction of sample height, which enables precisely measuring the roughness of material surfaces.
In addition to allowing high-resolution observation in the nanometre range, they are also capable of observing samples in either atmospheric conditions or in liquids. Such applications are spreading in research fields, such as surface physics, electronics, chemistry and biology, and have contributed to the development of nanosciences and nanotechnologies.
The SPM-9700 includes Windows 7-compatible software featuring an updated GUI (graphical user interface) design. The software also includes a guidance function that enables anyone to confidently perform operations from observing samples to analysing data, by simply following procedures displayed on the screen. In addition to displaying the observation point and range in an easy-to-understand manner, it also features a navigation function that allows freely navigating from a broad field of view to any specific area desired.
Furthermore, it now permits display of up to eight observation images.
Operability has been improved significantly in other ways as well, such as with improved SPM manager functionality that enables saving settings separately for each user and performing required observations smoothly after start-up, in the user’s preferred observation mode.
The software interface has a freely configurable layout that facilitates all steps, from sample observation to data analysis. It features a guidance function that allows users to observe samples by simply following the procedures displayed on the screen and a navigation function that more clearly indicates the location being observed and enables freely navigating from a broad field of view to any specific area desired. More easily recognised icons and buttons help users access the desired functions more quickly and enable confirming the instrument status at a glance.
Phone: 02 9684 4200
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