The X-MET5100 X-ray fluorescence (XRF) analyser combines Oxford Instrument’s Silicon Drift Detector (SDD) with a 45 kV X-ray tube. This technology delivers fast, accurate measurement and allows light elements such as Mg, Al and Si to be measured without the need for complex vacuum pump or helium tank attachments.
The product provides reliable analysis of aluminium and titanium alloys, as well as copper, nickel and steel.
The combination of the SDD, 45 kV X-ray tube and traceable empirical calibration mean that the instrument can accurately analyse and identify metal alloys in 1 s. Restricted elements, lead in toys, contaminants in soil and small concentrations in ores can be accurately measured at high speed. Trace element results, down to ppm level, can be achieved in seconds.
The instrument is IP54 (NEMA 3) approved for dust and water splash protection and built to withstand harsh analytical conditions.
Phone: 02 9484 6108
Pi Imaging SPAD Alpha high-performance single-photon camera
SPAD Alpha by Pi Imaging is a photon-counting camera for high-speed imaging and is suitable for...
Iconeus One functional ultrasound system
Iconeus's functional ultrasound (fUS) technology affords neuroscience and preclinical...
Confocal.nl NL5+ line-scanning confocal system
The NL5+ confocal system provides high-contrast images from thicker specimens such as organoids,...
