JEOL JSM-IT700HR scanning electron microscope

JEOL has released its high-throughput scanning electron microscope (SEM), the JSM-IT700HR, equipped with the company’s in-lens Schottky field emission electron gun (FEG) for high-definition image observation and high spatial-resolution analysis.

The product delivers a high resolution of 1 nm and a maximum probe current of 300 nA, providing a wealth of observation and analysis information. The user interface is simple to operate and the compact design accommodates a large specimen chamber, with a renewed anti-vibrational support for the main console to achieve comfortable observation and analysis.

The device incorporates a special function, integrated into the SEM GUI, to display the characteristic X-ray generation depth. This supports prompt understanding of the analysis depth for the specimen, which is useful for elemental analysis.

The powerful SEM is designed for observation and analysis of miniaturised materials in daily laboratory operation. Two configurations are available: JSM-IT700HR/LV for high and low vacuum image observation and JSM-IT700HR/LA with additional integrated JEOL EDS system.