JEOL JSM-IT800 Schottky field emission scanning electron microscope

Scanning electron microscopes (SEMs) are used in various fields, such as nanotechnology, metals, semiconductors, ceramics, medicine and biology. As SEM applications are expanding from research and development to quality control and product inspection at manufacturing sites, SEM users are in need of fast, high-quality data acquisition and simple compositional information confirmation with seamless operation.

JOEL’s JSM-IT800, with the Intelligence Technology (IT) platform, incorporates the company’s In-lens Schottky Plus field emission electron gun for various applications from high-resolution imaging to fast elemental mapping, and an innovative electron optical control system Neo Engine as well as a seamless GUI SEM Center for full integration of a JEOL energy dispersive X-ray spectrometer (EDS).

There are two versions available with two types of objective lens: the Hybrid Lens (HL) for general-purpose SEM and the Super Hybrid Lens (SHL) for enhanced resolution observation and various analyses. The SHL version comes with an Upper Hybrid Detector (UHD) realising higher signal-to-noise ratio images.

An optional Scintillator Backscattered Electron Detector (SBED) and Versatile Backscattered Electron Detector (VBED) are also available.