JPK OT-AFM Combi-System

The OT-AFM Combi-System from JPK is a combined optical tweezers and atomic force microscopy system. The combination of 3D positioning, detection and manipulation provided by the optical tweezers, and the high-resolution imaging and surface property characterisation of the atomic force microscopy, makes it suitable for applications such as cellular response, cell-cell or cell matrix interactions, immune response, infection or bacterial/virus/nanoparticle uptake processes, and more.

Following years of leadership in the fields of atomic force microscopy and optical tweezers for applications in nanotechnology for life science, JPK has brought the technologies together on a single inverted light microscope platform. The system pairs the surface force measurement and imaging capabilities of AFM with the ability of optical tweezers to apply and measure smallest forces in 3D.

Key features include imaging, positioning and manipulation experiments from single molecules to living cells. The system also measures forces in 2D and 3D from 500 fN to 10 nN on the same sample. Fully flexible and modular in design, the system offers a wide range of modes and accessories with comprehensive integration with optical microscopy techniques, such as TIRF and confocal.