Olympus BTX Profiler materials analysis benchtop unit

To provide comprehensive compositional materials analysis at the structural and elemental level, Olympus has developed the BTX Profiler. The stylish and functional benchtop unit combines X-ray diffraction (XRD) and X-ray fluorescence (XRF) analysis in a single instrument, delivering savings in operational costs, space and time along with seamless integration of data and results.

The product can be used in various applications, including energy exploration; mineral identification; ore-grade control; counterfeit drug screening; fire and explosives forensics; and corrosion monitoring. With full mineralogical and elemental analysis capabilities, it can be used for single sample measurement or for unattended multi-sample measurements when combined with an integrated autosampler.

The product is claimed to be more efficient than conventional powder diffraction systems. The close-coupled transmission geometry means that the device only requires a low powered X-ray source and a small amount of sample. The sample-handling technology incorporates a vibration system that enables random crystal orientation in a fixed sample cell. The CCD detector with its smart energy discrimination provides graphical 2D diffraction patterns, or ring patterns, and acquires more data more rapidly than conventional XRD detectors.

The unit’s Energy Dispersive XRF technology integrates selectable optimised beam paths of a miniature X-ray tube and specialised filters; a large-area silicon drift detector (SDD) for optimised resolution and detection limits; and close coupled geometry with the sample, allowing for a wide elemental and concentration measurement range. Its non-destructive capability is of particular significance for industrial sectors including energy, geochemistry, pharmaceuticals, catalysts, forensics and education.