Rigaku MiniFlex benchtop XRD system

Rigaku Corporation has announced the sixth-generation Rigaku MiniFlex benchtop X-ray diffraction (XRD) instrument.

The X-ray diffractometer is a multipurpose analytical instrument that can determine phase identification and quantification, per cent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement and molecular structure. It is widely used in research fields such as material science and chemistry, as well as in industry for research and quality control.

The system delivers speed and sensitivity through innovative technology, including the HyPix-400 MF 2D hybrid pixel array detector (HPAD) together with a 600 W X-ray source and an 8-position automatic sample changer. The direct photon counting detector enables high-speed, low-noise data collection and may be operated in 0D and 1D modes for conventional XRD analysis and 2D mode for samples with coarse grain size and/or preferred orientation.

A variety of X-ray tube anodes — along with a range of sample rotation and positioning accessories, together with a variety of temperature attachments — are offered to ensure that the system is versatile enough to perform challenging qualitative and quantitative analyses of a broad range of samples, whether performing research or routine quality control.