Thermo Scientific Talos F200E (S)TEM

Thermo Fisher Scientific has announced the Talos F200E scanning transmission electron microscope ((S)TEM), combining atomic-level resolution imaging and fast energy dispersive X-ray spectroscopy (EDS) analysis for the demands of the semiconductor industry.

Advances in communications technologies supported by the transition to 5G are continuing to spur the need for semiconductor devices that offer greater energy efficiency and performance. Autonomous vehicles, AI, Industry 4.0, smart cities and the Internet of Things (IoT) are all driving development of smaller, more complex semiconductor structures. To deliver the high-volume, reproducible (S)TEM results necessary to support such demands at the atomic scale, the semiconductor industry needs efficient solutions for its research and development labs.

The (S)TEM offers automated alignment with its ‘Align Genie’ feature as well as image distortion of ≤1%, enabling users to obtain quick and repeatable results. The optional DualX provides a larger EDS detector than previously available on the Talos F200X, enabling 1.5 times faster EDS analyses.

The Talos F200E is an easy-to-use system that delivers high-quality image data, fast chemical analysis and good defect characterisation. It is designed to allow semiconductor labs to achieve fast sample characterisation, accelerate time to production and improve manufacturing yields.