X-ray diffractometer

Monday, 01 December, 2008 | Supplied by: Varian Australia Pty Ltd

The SuperNova dual wavelength X-ray diffractometer from Oxford Diffraction is designed for the analysis of small molecules and proteins. The instrument uses high-intensity micro-source X-ray technology to determine the structure of small molecules and proteins at high resolution.

Applications include chemistry, geology, physics, structural biology and pharmaceutical research. The improvement in the intensity of X-ray radiation placed on the sample from the system’s dual X-ray micro-sources makes both higher resolution and higher throughput possible.

The system is suitable for the study of challenging samples in small molecule and protein crystallography. It includes co-mounted, dual-wavelength and high-intensity X-ray micro-sources of both molybdenum and copper wavelength. The high-intensity X-ray radiation allows for short X-ray exposure, as does the high-sensitivity, large-area Atlas CCD. Both enable fast data collection and the system has a short duty cycle (the dead time required for the CCD detector to transfer data to the computer).

The AutoChem software automates crystal structure solution, refinement and report generation.


Online: www.varianinc.com
Phone: 03 95607133
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