The Applied Analytics Eclipse Process 10 online analyser software has improved control over the detection system compared to previous versions, allowing for instantaneous user interface response. Simultaneous analysis and calibration methods (ACM) can also be configured with version 10.
Using several ACMs simultaneously can provide insight into the condition of the process.
The software includes diagnostics and reporting routines to continuously evaluate the performance of the system and trigger rapid action if required.
Features include: an ACM report generator; automatic light level adjustment; fault alarm condition set-up; and software-controlled relay activation from each screen.
The Eclipse software is an integrated part of Applied Analytics’ diode array analysers. It controls the spectrometer and the sampling valves, obtains and interprets data from the detector, provides a user interface with which to change parameters, and produces an output signal for the DCS.
The offline program allows the user to build an ACM, load or collect standards, and calibrate the analyser.
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