The JPK NanoWizard II Atomic Force Microscope (AFM) represents the latest in AFM technology for life sciences. It is designed to maximise stability, performance and ease of handling with samples in fluid and for full integration with optical microscopy.
The NanoWizard II is suitable for use in almost every research field including nanomanipulation, cell adhesion measurements, surface chemistry, DNA high-resolution imaging, bacteria, pharmaceuticals, electrochemistry and polymer melting.
The AFM is fully compatible with fluorescence techniques such as TIRF, FRET, FCS, FRAP, FLIM, Ca2+ response and laser scanning microscopy. The cantilever tip scanning technique of the NanoWizard II does not restrict the simultaneous use of any of the optical techniques.
Simultaneous use of phase contrast or DIC achieved with the cantilever tip scanning technique of the microscope.
The device features high stability and zero drift for long-term experiments and it is suitable for working with liquids as no sensitive parts are positioned below the sample level.
Phone: 03 9480 4999
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