Rigaku D/teX Ultra 250 1D silicon strip detector for XRD analysis

The D/teX Ultra 250 1D silicon strip detector from Rigaku is said to reduce data acquisition time by almost 50% compared to competitive detectors. This is achieved by increasing the active area of the aperture, which increases the overall count rate and has the added benefit of increasing the angular coverage of the detector. Good energy resolution, or X-ray fluorescence (XRF) suppression, is achieved through a combination of low-energy discrimination and a secondary monochromator.

The company has introduced the product as part of an ongoing effort to reduce the time of X-ray diffraction (XRD) data acquisition, thus improving instrument throughput and the ROI associated with the acquisition of an instrument. The silicon strip detector is available for use with Rigaku’s Smartlab diffractometer, a system noted for its innovative Guidance software, automated alignment and CBO optics.

The product has a number of improvements over the previous model including a smaller pixel pitch (0.075 versus 0.10 mm) for improved resolution, an increased length for improved count rate and angular coverage and an XRF suppression configuration that provides good energy resolution.