Asylum Research NanomechPro Toolkit for nanomechanical measurements

Wednesday, 22 April, 2015 | Supplied by: Oxford Instruments


The last several years have seen a surge in the development and use of techniques that enable the measurement of mechanical properties at the nanoscale. The NanomechPro Toolkit, from Asylum Research, is a collection of techniques that spans a large modulus range.

The product includes techniques that measure both the elastic and viscous response. It is said to leverage the high speed of the Asylum Research Cypher AFM to make these quantitative measurements faster than ever before. The various techniques each offer their own advantages and cover some portion of the total range of properties that researchers need to explore.

The toolkit consists of standard imaging modes that are included with every Asylum Research AFM, as well as several optional techniques. The standard modes include force curves and force volume mapping, phase imaging, bimodal dual AC imaging and loss tangent imaging. The optional modes include fast force mapping mode, instrumented vertical nanoindentation, force modulation imaging, AM-FM viscoelastic mapping mode and contact resonance viscoelastic mapping mode.

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