FEI takes quanta leap
Wednesday, 25 April, 2007
FEI has released a powerful analytical DualBeam for advanced 3D research and development, the Quanta 3D FEG.
Combining the latest advances in ion and electron optics and the unique environmental scanning electron microscopy (ESEM) technology of FEI's Quanta family of products, the new system eliminates the boundaries imposed by traditional high vacuum systems.
The system features FEI's high current ion column for rapid, site-specific cross-sections of samples to reveal sub-surface structures and features while the system's advanced electron source design delivers improved SEM imaging. Further, increased electron beam current enables higher throughput spectroscopy.
The Quanta 3D FEG's field-emission electron source delivers clear and sharp electron imaging. Featuring three imaging modes - high-vacuum, low-vacuum and ESEM - it accommodates the widest range of samples of any SEM system.
It is engineered to provide the widest range of data - imaging and microanalysis - from all specimens, with or without preparation. In-situ study of the dynamic behaviour of materials at different humidity levels (up to 100% RH) and temperatures (up to 1500°C) is also within the Quanta 3D FEG's capabilities.
Quanta 3D FEG features live SEM imaging while milling, making it a superior solution for fast preparation of large samples over a wide range of materials.
nanoTechnology Systems
Tel: 03 9432 8932
Email: jcarpenter@nanotechsys.com.au
www.nanotechsys.com.au
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