Analytical instrumentation

Temperature-controlled nanoparticle characterisation

01 December, 2008 | Supplied by: Particle & Surface Sciences Pty Ltd

NanoSight has announced additional temperature control capability for its family of instrumentation.


Coating thickness gauge

01 December, 2008 | Supplied by: SI Instruments

ElektroPhysik has released the MiniTest 700 range of digital coating thickness gauges featuring SIDSP technology.


Tension and compression tester

01 December, 2008 | Supplied by: SI Instruments

The Mecmesin MultiTest-d test system is available in 1 and 2.5 kN capacities. The tester works in conjunction with a digital force gauge and forms an entry-level motorised test system for evaluating quality control parameters in tension and compression.


X-ray diffractometer

01 December, 2008 | Supplied by: Varian Australia Pty Ltd

The SuperNova dual wavelength X-ray diffractometer from Oxford Diffraction is designed for the analysis of small molecules and proteins. The instrument uses high-intensity micro-source X-ray technology to determine the structure of small molecules and proteins at high resolution.


Aerosol backscatter analysis

01 December, 2008 | Supplied by: Ecotech Pty Ltd

The Aurora nephelometer is designed for use in backscatter global warming studies. It allows the analysis of aerosols by measuring their backscattering effect on light.


Imaging plate X-ray diffractometer

01 December, 2008 | Supplied by: Meeco Holdings Pty Ltd

The Rigaku R-axis HTC imaging plate (IP) detector features a three-plate system that allows for simultaneous expose, erase and readout operations. This means that the duty cycle is limited only by the speed of the IP transport from one position to the next, making the R-AXIS HTC highly efficient for screening samples and suitable for experiments with brief exposure times. It combines the high-throughput capability of a CCD with the large aperture size and dynamic range of an IP.


Non-contact measuring system

01 December, 2008 | Supplied by: Testequip Pty Ltd

The Kestrel from Vision Engineering is an easy-to-use, 2-axis non-contact measurement and inspection system that provides measurement accuracy and repeatability. The non-contact method provides a solution to accurately gauge precision-machined parts, like aerospace components, without deforming them.


Handheld XRF analyser

01 December, 2008 | Supplied by: Oxford Instruments

The X-MET5100 X-ray fluorescence (XRF) analyser combines Oxford Instrument’s Silicon Drift Detector (SDD) with a 45 kV X-ray tube. This technology delivers fast, accurate measurement and allows light elements such as Mg, Al and Si to be measured without the need for complex vacuum pump or helium tank attachments.


Small sample AFM/SPM

01 December, 2008 | Supplied by: The Innovation Group Pty Ltd

Asylum Research’s Cypher AFM achieves closed loop atomic resolution using sensors in all three axes, combining the accuracy of closed loop with the power of atomic resolution for accurate images and measurements.


Pyranometer calibration

01 December, 2008 | Supplied by: Ecotech Pty Ltd

Ecotech has extended its NATA accredited services to include calibrations of pyranometers.


Triple quadrupole LC-MS/MS system

06 November, 2008 | Supplied by: http://www.thermo.com/tsqvantage

Thermo Fisher Scientific's TSQ vantage LC-MS/MS increases sensitivity without increasing noise for better reproducibility, accuracy and precision in quantitative analysis.


Counting hair

03 November, 2008

CSIRO has developed maths-based imaging technology to measure hair on different parts of the human body.


Melamine detection kit

01 November, 2008 | Supplied by: Bio-Strategy Pty Ltd

The Abraxis Melamine Detection Kit is validated for use on MDS Analytical Technologies’ SpectraMax absorbance microplate readers with SoftMax Pro 5 GxP analytical software, which includes FDA 21 CFR Part 11 compliance.


Raman microscope

08 October, 2008 | Supplied by: Thermo Fisher Scientific

The Thermo Scientific DXR Raman microscope is designed to help non-specialist users achieve rapid sampling and analysis of particles, down to one-micron spatial resolution.


Back illuminated EMCCD camera

08 October, 2008 | Supplied by: http://www.scitech.com.au

Andor has available the iXonEM+, a dedicated, compact, truly high-end platform, designed to get the best from electron multiplying CCD (EMCCD) technology.


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