Phenom desktop SEM with X-ray for element ID

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The Phenom desktop SEM is a user-friendly tool that bridges the gap between optical and ultrahigh-resolution microscopes. The desktop SEM is said to exceed the resolution of optical microscopes and eliminate the delay and difficulty associated with operating a traditional SEM.

The desktop SEM system with integrated X-ray analysis enables both sample structures to be physically examined and their elemental composition determined. Benefits include: imaging power up to 100,000x magnification; intuitive system control; fully integrated X-ray analysis; <30 s from loading sample to SEM image using an integrated X, Y motor stage; optical navigation camera and low-magnification SEM imaging for navigation. 

The Phenom Pro suite software includes integrated ParticleMetric, Fibermetric, 3D Roughness and Elemental mapping applications that allow users to gather morphology and particle size data and to generate three-dimensional images while revealing the distribution of elements within the sample.

Applications include forensic investigation, material characterisation, metallurgy analysis, process control, pharmaceutical and industrial research, and more.