Phenom desktop SEM with PoroMetric software application

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Fully automated visualisation and analysis of pores can be realised using the Phenom desktop scanning electron microscope (SEM) with the PoroMetric software application. Using a long-life, high-brightness CeB₆ electron source, the product creates state-of-the-art images without the delay and difficulty associated with operating a traditional SEM.

The integrated X-ray analysis system and specially designed EDS detector enable both sample structures to be physically examined and their elemental composition determined. Benefits include: imaging power up to 100,000x magnification; ease of use by intuitive system control; fully integrated X-ray analysis; fast time from loading sample to SEM image (<30 s) by using an integrated X, Y motor stage; navigation by combination of optical navigation camera and low magnification SEM imaging.

PoroMetric meanwhile extracts detailed information of the complete set of pores to allow the user to get a better understanding of the characteristics of the materials. The user can easily analyse pore parameters such as pore size and aspect ratio and gather data on distribution of pores.

The combination of speed, ease of use and imaging quality of the Phenom and pore analysis software of PoroMetric creates a powerful tool for inspecting a wide range of samples like filters, membranes, foam, ceramics and other porous materials. Other Pro Suite applications include ParticleMetric, FiberMetric, 3D Roughness and Elemental mapping, allowing users to gather morphology and particle size data and to generate three-dimensional images.

The product is suitable for forensic investigation, material characterisation, metallurgy analysis, process control, pharmaceutical and industrial research and more.