Phenom ProX 5th generation desktop SEM

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Although many laboratories still use optical microscopy for general inspection purposes, scanning electron microscopes can provide much higher image resolution and magnification to describe surface topography and composition. Large SEMs typically found in university microscopy centres can require intensive operator training. The Phenom ProX desktop scanning electron microscope (SEM) offers an alternative, providing a fast, easy-to-use desktop SEM system to rapidly study the external shape and composition of an object.

The 5th generation ProX SEM is the latest addition to the Phenom series and offers fast, high-resolution imaging (up to 150,000x magnification) and fast sample loading (<30 s) with ease of use. Unlike other systems, the desktop Phenom ProX has fully integrated X-ray analysis (energy dispersive spectrometer, EDS) that allows the user to quickly identify and assess the distribution of elements in a sample. The long-life CeB6 electron source, in combination with two detectors — the four-segment backscatter detector (BSD) for chemical contrast information and the secondary electron detector (SED) for surface sensitive imaging — supports high-resolution imaging (<8 nm) to yield sharp images.

The product can help to expand capabilities for a wide range of applications. When combined with the programming interface (PPI) automation script, the SEM can be used to study the coverage of phosphate coatings and crystal morphology on metallic objects. Vacuum-sensitive and vulnerable samples such as biological, food or organic coatings can be studied using the temperature-controlled sample holder.