Phenom-World 5th generation Phenom Pro and ProX series of desktop SEMs

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The 5th generation Phenom Pro and ProX series of desktop SEMs by Phenom-World feature enhanced imaging, a 20% resolution improvement and added software to significantly widen the application range.

The Phenom SEM maintains its ease of use with the NeverLost navigation and integrated automated stage. It features high throughput with analysis and full imaging of large samples up to 100 x 100 mm. Elemental analysis (EDS technology) can be added, while a secondary electron detector (SED) is available for applications that require surface and topography sensitive imaging.

The Phenom desktop scanning electron microscope (SEM) has become a useful characterisation tool particularly for laboratories focused on materials, electronics, environmental, life sciences and forensics applications. Continual improvements from Phenom, combined with more applications arising, have led to further developments and capabilities.

Accessories include the Eucentric Sample Holder, which allows users to quickly and safely tilt and rotate samples while imaging. A real-time 3D visualisation module shows the actual sample position and orientation at all times, from any position. Samples can be tilted up to angles of 90° without risk of collision enabling for worry-free operation.

The Tensile stage meanwhile allows users to examine how materials will react when they are pulled apart or pushed together when a tension force is applied. By measuring the force required to elongate a sample to breaking point, material properties can be determined to predict how products will behave in their intended applications.

For more information: http://bit.ly/2wcKkBq.