CAMECA SXFive-TACTIS electron probe microanalyser

Thursday, 29 November, 2018 | Supplied by: AMATEK DESIGN

CAMECA has announced the SXFive-TACTIS microanalytical instrument — an electron probe microanalyser (EPMA) with a touch-screen interface. The product is designed to meet a growing demand from multi-user research facilities for instrumentation that combines sophisticated analytical options with ease of use.

Users can choose between two tool operation modes. In beginner mode, the instrument configuration and operation, as well as basic imaging and data processing, are made easy with an intuitive touch-screen interface that gives immediate access to a wealth of simplified options. In expert mode, the interface is designed for skilled users who can benefit from a full complement of different tool parameters and software options.

Among the other technological advances are an additional backscattered electron (BSE) detector for enhanced imaging especially at low voltage; a fully integrated energy dispersive spectroscopy (EDS) hyper-mapping module for ultrafast quantitative analysis; and the capability to acquire real-time wavelength dispersive spectroscopy (WDS) and EDS X-ray images. The instrument can be fully remote controlled, allowing users to run experiments from their smartphones, tablets or any remote computer.

The EPMA platform is available with a W, LaB6 or field-emission source. CAMECA has optimised the performance for challenging microanalytical applications at a sub-micron spatial resolution, extending EPMA capabilities to smaller analysed volumes.

Equipped with high-precision spectrometers for good reproducibility, the product delivers high-quality minor and trace element analysis, addressing demanding analytical tasks in mineralogy, geochronology, ore discovery and nuclear science, as well as research in materials, metals, thin films and semiconductors.

Phone: 02 9411 3618
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