The FOSS XDS MasterLab NIR System provides NIR analysis for rapid non-destructive measurements of solid dosage forms and solids in vials.
Its features and benefits include: XDS NIR technology for ease of use and transferability; automated transmission or reflectance analysis of a tray of multiple tablets, capsules, or vials; integrated variable spot-size for optimal sample illumination; non-destructive analysis of solids and liquids in less than a minute; no sample preparation, no reagents and no waste; network-ready analyser for centralised database management; and hot-swappable modules.
Phone: 02 9888 6788
Nanosurf DriveAFM tip-scanning AFM instrument
Nanosurf's DriveAFM is a tip scanning AFM instrument that it suitable for life science...
TOPTICA TeraScan ultra continuous-wave terahertz platform
TOPTICA Photonics has launched the TeraScan ultra — an ultrahigh-precision continuous-wave...
HAWK Biosystems Violet 3.0 all-in-one microscopy platform for QF-Pro technology
HAWK Biosystems' Violet 3.0, an all-in-one microscopy platform for QF-Pro technology, has...
