Hitachi Ethos NX5000 FIB-SEM

Monday, 10 December, 2018 | Supplied by: Hitachi Australia Ltd



The Hitachi Ethos FIB-SEM incorporates the latest-generation FE-SEM with beam brightness and stability. Ethos is designed to deliver high-resolution imaging at low voltages combined with ion optics for nanoscale precision processing.

Features include: high-performance FE-SEM column with dual lens mode; high-throughput material processing; microsampling system; triple-beam capable; large multiport chamber and stage for various applications.

The Ethos SEM column is composed of a magnetic- and electrostatic-field compound objective lens system configured as two lens modes. High Resolution (HR) mode achieves sample observation at high resolution by immersing the sample within the magnetic field of the lens system. Field Free (FF) mode offers real-time FIB processing for high accuracy end point milling. Hyper switching between FIB irradiation and SEM imaging as fast as 10 ns offers real-time fabrication and observation views with clarity.

Online: www.hitachi.com.au
Phone: 02 9888 4100
Related Products

SPECTRO SPECTROLAB S OES analyser for metal analysis

SPECTRO Analytical Instruments introduces the SPECTROLAB S high-performance arc/spark optical...

SPECTRO SPECTROCUBE ED-XRF benchtop spectrometer

The SPECTROCUBE ED-XRF benchtop spectrometer incorporating non-destructive ED-XRF detector...

TESCAN CLARA scanning electron microscope

The TESCAN CLARA is a versatile, ultrahigh-resolution scanning electron microscope (SEM) that has...


  • All content Copyright © 2019 Westwick-Farrow Pty Ltd