Hitachi TM3030Plus SEM with EDX for elemental analysis

Hitachi has released the latest model in its tabletop SEM range, the TM3030Plus. The SEM features an ultravariable-pressure detector (UVD) for low-vacuum SE imaging and a high-sensitivity, four-segment BSE detector for high-quality compositional imaging. The UVD has been adapted from the SU3500 premium VP SEM.

Low vacuum minimises moisture evaporation and subsequent shrinkage of samples, reducing the need for chemical processing and critical point drying (CPD) or freeze drying. Moisture evaporation can be further reduced by purchasing an optional -50°C cooling stage.

Low vacuum also reduces surface-charging effects on electrically non-conductive samples such as insects, microorganisms, leaves, pollen, paper, wood, fabric, plastic, ceramics, etc. Again, an optional cooling stage can further minimise thermal damage due to the electron beam on sensitive samples.

The product can identify elemental information by using an optional EDX system manufactured by Bruker or Oxford Instruments. EDX systems can detect elements from B to Am in both low and high vacuums. Dedicated software modules for data capture, automated element ID, elemental mapping, point and line scan, and automatic report generation simplify the identification of unknown materials.

Other features include: one-click auto start; auto focus, auto brightness and contrast; colour camera navigation; XYTR motorised stage; 3D view; maximum sample size 70 mm diameter and 50 mm height; 120,000x magnification; SE/BSE mixed-signal mode; and three vacuum levels.

The product is suitable for users requiring good image quality with high throughput where biological or non-conductive samples necessitate minimal sample preparation.