JPK Instruments NanoWizard ULTRA Speed atomic force microscope
The JPK Instruments NanoWizard ULTRA Speed AFM (atomic force microscope) allows the tracking of changes in samples in real time. Scanning at speeds with a >100 Hz line rate, with very good, true atomic resolution in closed-loop mode, is enabled by the enhanced low noise of scanner, position sensor and detection system.
The range provides specialised solutions for soft matter and life science applications. All NanoWizard systems provide true integration of AFM with optical microscopy through the DirectOverlay feature for precise and easy work, and come with a large variety of options and accessories.
Phone: 03 9480 4999
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