Nanosurf has made the FlexAFM atomic force microscope versatile and flexible, allowing a large variety of applications to be performed easily. It can be used in air or liquid environments, materials science or life science applications, standard imaging or advanced measurement modes, on a standard sample stage or on an inverted microscope.
The product is compatible with many types of inverted microscopes and readily combines AFM and optical data (fluorescence/phase contrast/bright field). Flat and linear scanning is achieved due to the flexure-based scanner technology. Flexibility is achieved with exchangeable cantilever holders that have been optimised for specialised tasks.
Measurement modes include lateral force microscopy, Kelvin probe force microscopy, scanning thermal microscopy and fluid force microscopy.
Phone: 03 9480 4999
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