Oxford Instruments Ultim Scanning Electron Microscopy/Energy Dispersive X-Ray Spectroscopy (SEM/EDS) detectors
The Oxford Instruments Ultim Scanning Electron Microscopy/Energy Dispersive X-Ray Spectroscopy (SEM/EDS) detectors feature big sensor sizes and fast electronics that deliver high sensitivity and speed.
The Ultim Max 65 mm2 and 40 mm2 models have been released to complete the Ultim range and join the 170 mm2, 100 mm2 and the ultra-high sensitivity windowless Ultim Extreme detector, launched in 2017, to provide a complete range of microanalysis system.
Paired with Oxford Instruments AZtecLive real-time EDS analysis software as standard, live sample navigation by chemistry in an electron microscope is possible. This capability changes EDS from a traditional static approach to dynamic, interactive analysis.
The solution offers live imaging, X-ray mapping and element identification, and the range of Ultim detectors makes the most challenging analysis possible.
Phone: 02 9420 0477
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