Oxford Instruments Ultim Scanning Electron Microscopy/Energy Dispersive X-Ray Spectroscopy (SEM/EDS) detectors

The Oxford Instruments Ultim Scanning Electron Microscopy/Energy Dispersive X-Ray Spectroscopy (SEM/EDS) detectors feature big sensor sizes and fast electronics that deliver high sensitivity and speed.

The Ultim Max 65 mm² and 40 mm² models have been released to complete the Ultim range and join the 170 mm², 100 mm² and the ultra-high sensitivity windowless Ultim Extreme detector, launched in 2017, to provide a complete range of microanalysis system.

Paired with Oxford Instruments AZtecLive real-time EDS analysis software as standard, live sample navigation by chemistry in an electron microscope is possible. This capability changes EDS from a traditional static approach to dynamic, interactive analysis.

The solution offers live imaging, X-ray mapping and element identification, and the range of Ultim detectors makes the most challenging analysis possible.