Oxford Instruments Ultim Scanning Electron Microscopy/Energy Dispersive X-Ray Spectroscopy (SEM/EDS) detectors

Tuesday, 20 November, 2018 | Supplied by: Scitek Australia Pty Ltd


The Oxford Instruments Ultim Scanning Electron Microscopy/Energy Dispersive X-Ray Spectroscopy (SEM/EDS) detectors feature big sensor sizes and fast electronics that deliver high sensitivity and speed.

The Ultim Max 65 mm2 and 40 mm2 models have been released to complete the Ultim range and join the 170 mm2, 100 mm2 and the ultra-high sensitivity windowless Ultim Extreme detector, launched in 2017, to provide a complete range of microanalysis system.

Paired with Oxford Instruments AZtecLive real-time EDS analysis software as standard, live sample navigation by chemistry in an electron microscope is possible. This capability changes EDS from a traditional static approach to dynamic, interactive analysis.

The solution offers live imaging, X-ray mapping and element identification, and the range of Ultim detectors makes the most challenging analysis possible.

Online: www.scitek.com.au
Phone: 1800 023 467
Related Products

Jenoptik GRYPHAX Rigel monochrome microscope camera

The Jenoptik GRYPHAX Rigel is a monochrome microscope camera engineered for fluorescence...

Azure Biosystems Azure 400 Chemiluminescent Western Blot Imager

The Azure 400 by Azure Biosystems is a multichannel imaging system designed for...

Charm EZ Protect+ System Antibiotic Residue Testing

The Charm EZ Protect+ System is designed to bring rapid, reliable antibiotic residue testing to...


  • All content Copyright © 2026 Westwick-Farrow Pty Ltd