Nikon Metrology SMZ1270, SMZ1270i and SMZ800N stereo microscopes
11 November, 2014Nikon Metrology has released three stereomicroscopes: the SMZ1270, a stereo microscope with a large zoom ratio; the SMZ1270i, a version of SMZ1270 with intelligent features; and the SMZ800N, with enhanced optics and operability.
Motic BA410 Elite upright microscope for biomedical applications
22 October, 2014Motic has released the BA410 Elite upright microscope - a refined and upgraded version of the BA410 for all biomedical applications. The product allows for profound diagnosis in pathology, haematology and cytology.
Andor Revolution DSD2 confocal microscopy system
14 October, 2014The Andor Revolution DSD2 is a simple confocal device that delivers good imaging performance. Its simplicity lies in a compact optical design and laser-free operation, providing ease of retrofit to an existing fluorescence microscope or an easy addition to most new models currently available.
Hitachi TM3030Plus SEM with EDX for elemental analysis
10 September, 2014Hitachi has released the latest model in its tabletop SEM range, the TM3030Plus. The SEM features an ultravariable-pressure detector (UVD) for low-vacuum SE imaging and a high-sensitivity, four-segment BSE detector for high-quality compositional imaging.
Laser beams to make microscopes more sensitive
25 August, 2014Laser physicists from the Australian National University (ANU) have found a way to make atomic-force microscope probes 20 times more sensitive.
Turn a $40 needle into a 3D microscope
20 August, 2014Researchers from the University of Utah have discovered a method for turning a small, $40 needle into a 3D microscope capable of taking images up to 70 times smaller than the width of a human hair.
Phenom desktop SEM with X-ray for element ID
30 July, 2014The Phenom desktop SEM is a user-friendly tool that bridges the gap between optical and ultrahigh-resolution microscopes. The desktop SEM is said to exceed the resolution of optical microscopes and eliminate the delay and difficulty associated with operating a traditional SEM.
JPK Instruments NanoWizard ULTRA Speed atomic force microscope
19 June, 2014The JPK Instruments NanoWizard ULTRA Speed AFM (atomic force microscope) allows the tracking of changes in samples in real time. Scanning at speeds with a >100 Hz line rate, with very good, true atomic resolution in closed-loop mode, is enabled by the enhanced low noise of scanner, position sensor and detection system.
Zeiss Smartzoom 5 digital microscope for quality control
28 May, 2014Smartzoom 5 is a digital microscope from Zeiss, suitable for quality control and quality assurance applications in virtually every field of industry. The integrated complete system comprises an optical engine, a stand with sample stage, objective lenses, the operating unit and software.
Zeiss Primotech materials microscopy system
27 May, 2014Primotech is an imaging system for material analysis. The product can be used in industrial quality control, geology, mineralogy and education environments.
Zeiss Xradia X-ray microscopy products
26 May, 2014X-ray microscopes produce 3D images within objects at a high resolution in a non-destructive environment. Zeiss Xradia X-ray microscopy products are suitable for advanced material research, natural resources and geology, semiconductor process optimisation and life science applications.
Bake your own microscope lens
30 April, 2014Australian scientists have invented a simple way of making a high-powered lens that costs less than a cent and can transform a smartphone into a high-resolution microscope.
Tescan and WITec Raman Imaging Scanning Electron (RISE) Microscopy system
02 April, 2014Tescan Orsay Holding and WITec have launched RISE Microscopy - a correlative microscopy technique which combines confocal Raman imaging and scanning electron (RISE) microscopy within one integrated microscope system.
Rigaku nano3DX X-ray microscope
18 February, 2014The nano3DX, from Rigaku, is a true X-ray microscope (XRM) with the ability to measure relatively large samples at high resolution. The product images the entire sample from multiple angles and can thus reconstruct a 3D image at 0.27 µm resolution.
Removing distortion from atomic-scale images
31 January, 2014Microscopy researchers at North Carolina State University have developed a technique that eliminates the distortion encountered when capturing images at the atomic scale. Their method will be reported in the March issue of Ultramicroscopy.
