The TracerturboSD handheld X-ray fluorescence (XRF) instrument uses a silicon drift detector (SDD) for improved speed, sensitivity and resolution. Bruker’s XFlash SDD, previously available only in high-performance laboratory XRF instruments, now offers speed and analytical specificity when integrated into the handheld TracerturboSD.
All high XRF user segments can benefit from the performance advantages in their analytical work. For example, in art conservation and archaeology analysis the much better SDD energy resolution offers a gain in specificity and information content. In the aerospace industry, the Bruker SDD technology enables TracerturboSD users to better and faster analyse sophisticated light element alloys, even without the use of a vacuum or helium attachment. Finally, in the general metals analysis markets the TracerturboSD offers higher speed, sensitivity and selectivity for many demanding handheld XRF applications.
In addition to the high-end TracerturboSD, Bruker AXS continues to offer the standard S1 Tracer handheld instrument with traditional SiPIN diode technology for routine analysis.
Phone: 03 9474 7000
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