JEOL JSM-IT810 Schottky field emission scanning electron microscope

With field emission scanning electron microscopes widely used in research institutes, universities and industry, there is a growing demand for an instrument that can be used easily, accurately, quickly and efficiently from observation to analysis. With this in mind, JEOL has launched its JSM-IT810 Schottky field emission scanning electron microscopes.

The product features the automatic observation and analysis function ‘Neo Action’. The user simply selects the SEM image acquisition conditions and field of view and the function automatically performs SEM observation and EDS (energy dispersive X-ray spectroscopy) analysis; this helps to improve the efficiency of routine work, including analysis work. The automatic calibration function ‘SEM Automatic Adjustment Package’ meanwhile enables automatic execution of the selected items in alignment adjustment, magnification adjustment and EDS energy calibration.

The product is capable of live 3D, live analysis and live map functions. 3D images can be constructed on the spot while an SEM observation is being performed to obtain unevenness and depth information. Observation by SEM and analysis by EDS are integrated, with analysis of point, area and MAP able to be performed from the observation screen.