Thermo Scientific Spectra scanning/transmission electron microscope

The Thermo Scientific Spectra scanning/transmission electron microscope (S/TEM) delivers atomic-scale imaging and analysis in one easy-to-use tool. Suitable for researchers who need to characterise a wide variety of materials at the atomic level, it combines a high S/TEM image resolution specification and high sensitivity.

The device’s detection capabilities allow scientists to acquire atomic-level data for a range of applications. The platform makes it possible to obtain detailed images of beam-sensitive materials and semiconductor structures including metal organic frameworks, zeolites and polymers that can be damaged or destroyed if exposed to the electron beam for too long or at the wrong voltage. It also meets the demand for high volumes of atomic-level chemical analysis using several modalities such as EDX (energy-dispersive X-ray) or EELS (electron energy loss spectroscopy).

The product features a bright cold field emission gun (X-CFEG) that offers high-contrast imaging. For chemical analysis and X-ray analytics, it is said to provide more than twice the signal and greater than 10% higher spatial resolution than conventional CFEG sources found in current TEMs.

The X-FEG/Ultimono source allows researchers to generate complex high energy resolution data in parallel rather than dedicating a separate tool for that single purpose. The electron microscope pixel array detector (EMPAD) meanwhile allows researchers to perform a large number of applications such as ptychography for super-high resolution and user segmentation of signals.

Spectra 300 includes three source options — an XFEG Mono, X-FEG UltiMono and an X-CFEG — and is designed for atomic-level imaging and analysis of a wide variety of samples. Spectra 200 offers a 200 kV C-FEG and is suitable for high-contrast imaging and chemical analysis.