Analytical instrumentation

Range of COD analysers

03 December, 2008 | Supplied by: Aqua Diagnostic Pty Ltd

Aqua Diagnostic’s PeCOD COD analysers are a new technology for measuring COD and provide users with the benefits of real-time process control and environmental monitoring in industries involved in wastewater treatment, using coolant water or water feedstock or seawater in their manufacturing processes.

Photo diode array for LC systems

01 December, 2008 | Supplied by: PerkinElmer Pty Ltd

The Series 275 HRes photo diode array is designed to accelerate productivity and performance for laboratories performing LC analysis. Coupled into a Series 275 HRes LC system, the product is claimed to provide improved peak identification and peak purity determination in addition to increased throughput.

Tension and compression tester

01 December, 2008 | Supplied by: SI Instruments

The Mecmesin MultiTest-d test system is available in 1 and 2.5 kN capacities. The tester works in conjunction with a digital force gauge and forms an entry-level motorised test system for evaluating quality control parameters in tension and compression.

Pyranometer calibration

01 December, 2008 | Supplied by: Ecotech Pty Ltd

Ecotech has extended its NATA accredited services to include calibrations of pyranometers.

Benchtop materials testing

01 December, 2008 | Supplied by: Power Parameters Pty Ltd

Tinius Olsen has released a range of benchtop-mounted universal testing machines ranging in capacity from 1 to 50 kN. The 1 and 5 kN machines are single column while the 10, 25 and 50 kN machines are dual column.

Imaging plate X-ray diffractometer

01 December, 2008 | Supplied by: Meeco Holdings Pty Ltd

The Rigaku R-axis HTC imaging plate (IP) detector features a three-plate system that allows for simultaneous expose, erase and readout operations. This means that the duty cycle is limited only by the speed of the IP transport from one position to the next, making the R-AXIS HTC highly efficient for screening samples and suitable for experiments with brief exposure times. It combines the high-throughput capability of a CCD with the large aperture size and dynamic range of an IP.

Non-contact measuring system

01 December, 2008 | Supplied by: Testequip Pty Ltd

The Kestrel from Vision Engineering is an easy-to-use, 2-axis non-contact measurement and inspection system that provides measurement accuracy and repeatability. The non-contact method provides a solution to accurately gauge precision-machined parts, like aerospace components, without deforming them.

Aerosol backscatter analysis

01 December, 2008 | Supplied by: Ecotech Pty Ltd

The Aurora nephelometer is designed for use in backscatter global warming studies. It allows the analysis of aerosols by measuring their backscattering effect on light.

X-ray diffractometer

01 December, 2008 | Supplied by: Varian Australia Pty Ltd

The SuperNova dual wavelength X-ray diffractometer from Oxford Diffraction is designed for the analysis of small molecules and proteins. The instrument uses high-intensity micro-source X-ray technology to determine the structure of small molecules and proteins at high resolution.

Handheld XRF analyser

01 December, 2008 | Supplied by: Oxford Instruments

The X-MET5100 X-ray fluorescence (XRF) analyser combines Oxford Instrument’s Silicon Drift Detector (SDD) with a 45 kV X-ray tube. This technology delivers fast, accurate measurement and allows light elements such as Mg, Al and Si to be measured without the need for complex vacuum pump or helium tank attachments.

Coating thickness gauge

01 December, 2008 | Supplied by: SI Instruments

ElektroPhysik has released the MiniTest 700 range of digital coating thickness gauges featuring SIDSP technology.

Thickness gauge

01 December, 2008 | Supplied by: IDM Instruments

The Thickness Gauge Digital Indicator with Stand is a small, lightweight instrument that can be used on many different materials. With a 12 mm range, a measuring foot of 5 mm and an accuracy of 0.003 mm, it is suitable for the laboratory or the production line.

LC columns

01 December, 2008 | Supplied by: Dionex Pty Ltd

The Acclaim Rapid Separation LC (RSLC) 2 µm bonded silica columns provide a 2.1 mm internal diameter in both 50 and 100 mm lengths and are packed with Dionex C18 or Polar Advantage II (PA2) stationary phase.

Universal tester

01 December, 2008 | Supplied by: IDM Instruments

Designed with dual testing capabilities, the Universal Testing Machine enables compression testing in the centre of the machine and tensile testing on the outer.

Small sample AFM/SPM

01 December, 2008 | Supplied by: The Innovation Group Pty Ltd

Asylum Research’s Cypher AFM achieves closed loop atomic resolution using sensors in all three axes, combining the accuracy of closed loop with the power of atomic resolution for accurate images and measurements.

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