Tension and compression tester
01 December, 2008 | Supplied by: SI Instruments
The Mecmesin MultiTest-d test system is available in 1 and 2.5 kN capacities. The tester works in conjunction with a digital force gauge and forms an entry-level motorised test system for evaluating quality control parameters in tension and compression.
Handheld XRF analyser
01 December, 2008 | Supplied by: Oxford Instruments
The X-MET5100 X-ray fluorescence (XRF) analyser combines Oxford Instrument’s Silicon Drift Detector (SDD) with a 45 kV X-ray tube. This technology delivers fast, accurate measurement and allows light elements such as Mg, Al and Si to be measured without the need for complex vacuum pump or helium tank attachments.
Pyranometer calibration
01 December, 2008 | Supplied by: Ecotech Pty Ltd
Ecotech has extended its NATA accredited services to include calibrations of pyranometers.
Small sample AFM/SPM
01 December, 2008 | Supplied by: The Innovation Group Pty Ltd
Asylum Research’s Cypher AFM achieves closed loop atomic resolution using sensors in all three axes, combining the accuracy of closed loop with the power of atomic resolution for accurate images and measurements.
Universal tester
01 December, 2008 | Supplied by: IDM Instruments
Designed with dual testing capabilities, the Universal Testing Machine enables compression testing in the centre of the machine and tensile testing on the outer.
X-ray diffractometer
01 December, 2008 | Supplied by: Varian Australia Pty Ltd
The SuperNova dual wavelength X-ray diffractometer from Oxford Diffraction is designed for the analysis of small molecules and proteins. The instrument uses high-intensity micro-source X-ray technology to determine the structure of small molecules and proteins at high resolution.
LC columns
01 December, 2008 | Supplied by: Dionex Pty Ltd
The Acclaim Rapid Separation LC (RSLC) 2 µm bonded silica columns provide a 2.1 mm internal diameter in both 50 and 100 mm lengths and are packed with Dionex C18 or Polar Advantage II (PA2) stationary phase.
Coating thickness gauge
01 December, 2008 | Supplied by: SI Instruments
ElektroPhysik has released the MiniTest 700 range of digital coating thickness gauges featuring SIDSP technology.
Thickness gauge
01 December, 2008 | Supplied by: IDM Instruments
The Thickness Gauge Digital Indicator with Stand is a small, lightweight instrument that can be used on many different materials. With a 12 mm range, a measuring foot of 5 mm and an accuracy of 0.003 mm, it is suitable for the laboratory or the production line.
Benchtop materials testing
01 December, 2008 | Supplied by: Power Parameters Pty Ltd
Tinius Olsen has released a range of benchtop-mounted universal testing machines ranging in capacity from 1 to 50 kN. The 1 and 5 kN machines are single column while the 10, 25 and 50 kN machines are dual column.
Aerosol backscatter analysis
01 December, 2008 | Supplied by: Ecotech Pty Ltd
The Aurora nephelometer is designed for use in backscatter global warming studies. It allows the analysis of aerosols by measuring their backscattering effect on light.
Triple quadrupole LC-MS/MS system
06 November, 2008 | Supplied by: http://www.thermo.com/tsqvantage
Thermo Fisher Scientific's TSQ vantage LC-MS/MS increases sensitivity without increasing noise for better reproducibility, accuracy and precision in quantitative analysis.
Counting hair
03 November, 2008
CSIRO has developed maths-based imaging technology to measure hair on different parts of the human body.
Raman microscope
08 October, 2008 | Supplied by: Thermo Fisher Scientific
The Thermo Scientific DXR Raman microscope is designed to help non-specialist users achieve rapid sampling and analysis of particles, down to one-micron spatial resolution.
Back illuminated EMCCD camera
08 October, 2008 | Supplied by: http://www.scitech.com.au
Andor has available the iXonEM+, a dedicated, compact, truly high-end platform, designed to get the best from electron multiplying CCD (EMCCD) technology.
