Automated force spectroscopy
01 January, 2009 | Supplied by: SciTech Pty Ltd
JPK Instruments has released its ForceRobot system to automate force spectroscopy.
Polarised FTIR measurements
01 January, 2009 | Supplied by: PerkinElmer (Australia) Pty Ltd
PerkinElmer has released a Universal Attenuated Total Reflection (ATR) polarisation accessory, designed to offer users the benefits of combining infrared spectroscopy with a polariser. Polarised measurements provide additional information on the molecular structure of a sample, particularly the crystal or molecular orientation, and help in the accurate characterisation of materials.
Range of COD analysers
03 December, 2008 | Supplied by: Aqua Diagnostic Pty Ltd
Aqua Diagnostic’s PeCOD COD analysers are a new technology for measuring COD and provide users with the benefits of real-time process control and environmental monitoring in industries involved in wastewater treatment, using coolant water or water feedstock or seawater in their manufacturing processes.
Photo diode array for LC systems
01 December, 2008 | Supplied by: PerkinElmer (Australia) Pty Ltd
The Series 275 HRes photo diode array is designed to accelerate productivity and performance for laboratories performing LC analysis. Coupled into a Series 275 HRes LC system, the product is claimed to provide improved peak identification and peak purity determination in addition to increased throughput.
LC columns
01 December, 2008 | Supplied by: Dionex Pty Ltd
The Acclaim Rapid Separation LC (RSLC) 2 µm bonded silica columns provide a 2.1 mm internal diameter in both 50 and 100 mm lengths and are packed with Dionex C18 or Polar Advantage II (PA2) stationary phase.
Coating thickness gauge
01 December, 2008 | Supplied by: SI Instruments
ElektroPhysik has released the MiniTest 700 range of digital coating thickness gauges featuring SIDSP technology.
Tension and compression tester
01 December, 2008 | Supplied by: SI Instruments
The Mecmesin MultiTest-d test system is available in 1 and 2.5 kN capacities. The tester works in conjunction with a digital force gauge and forms an entry-level motorised test system for evaluating quality control parameters in tension and compression.
Imaging plate X-ray diffractometer
01 December, 2008 | Supplied by: Meeco Holdings Pty Ltd
The Rigaku R-axis HTC imaging plate (IP) detector features a three-plate system that allows for simultaneous expose, erase and readout operations. This means that the duty cycle is limited only by the speed of the IP transport from one position to the next, making the R-AXIS HTC highly efficient for screening samples and suitable for experiments with brief exposure times. It combines the high-throughput capability of a CCD with the large aperture size and dynamic range of an IP.
X-ray diffractometer
01 December, 2008 | Supplied by: Varian Australia Pty Ltd
The SuperNova dual wavelength X-ray diffractometer from Oxford Diffraction is designed for the analysis of small molecules and proteins. The instrument uses high-intensity micro-source X-ray technology to determine the structure of small molecules and proteins at high resolution.
Thickness gauge
01 December, 2008 | Supplied by: IDM Instruments
The Thickness Gauge Digital Indicator with Stand is a small, lightweight instrument that can be used on many different materials. With a 12 mm range, a measuring foot of 5 mm and an accuracy of 0.003 mm, it is suitable for the laboratory or the production line.
Benchtop materials testing
01 December, 2008 | Supplied by: Power Parameters Pty Ltd
Tinius Olsen has released a range of benchtop-mounted universal testing machines ranging in capacity from 1 to 50 kN. The 1 and 5 kN machines are single column while the 10, 25 and 50 kN machines are dual column.
Non-contact measuring system
01 December, 2008 | Supplied by: Testequip Pty Ltd
The Kestrel from Vision Engineering is an easy-to-use, 2-axis non-contact measurement and inspection system that provides measurement accuracy and repeatability. The non-contact method provides a solution to accurately gauge precision-machined parts, like aerospace components, without deforming them.
Handheld XRF analyser
01 December, 2008 | Supplied by: Oxford Instruments
The X-MET5100 X-ray fluorescence (XRF) analyser combines Oxford Instrument’s Silicon Drift Detector (SDD) with a 45 kV X-ray tube. This technology delivers fast, accurate measurement and allows light elements such as Mg, Al and Si to be measured without the need for complex vacuum pump or helium tank attachments.
Pyranometer calibration
01 December, 2008 | Supplied by: Ecotech Pty Ltd
Ecotech has extended its NATA accredited services to include calibrations of pyranometers.
Temperature-controlled nanoparticle characterisation
01 December, 2008 | Supplied by: Particle & Surface Sciences Pty Ltd
NanoSight has announced additional temperature control capability for its family of instrumentation.
