Aerosol backscatter analysis
01 December, 2008 | Supplied by: Ecotech Pty Ltd
The Aurora nephelometer is designed for use in backscatter global warming studies. It allows the analysis of aerosols by measuring their backscattering effect on light.
LC columns
01 December, 2008 | Supplied by: Dionex Pty Ltd
The Acclaim Rapid Separation LC (RSLC) 2 µm bonded silica columns provide a 2.1 mm internal diameter in both 50 and 100 mm lengths and are packed with Dionex C18 or Polar Advantage II (PA2) stationary phase.
Non-contact measuring system
01 December, 2008 | Supplied by: Testequip Pty Ltd
The Kestrel from Vision Engineering is an easy-to-use, 2-axis non-contact measurement and inspection system that provides measurement accuracy and repeatability. The non-contact method provides a solution to accurately gauge precision-machined parts, like aerospace components, without deforming them.
Photo diode array for LC systems
01 December, 2008 | Supplied by: PerkinElmer (Australia) Pty Ltd
The Series 275 HRes photo diode array is designed to accelerate productivity and performance for laboratories performing LC analysis. Coupled into a Series 275 HRes LC system, the product is claimed to provide improved peak identification and peak purity determination in addition to increased throughput.
Universal tester
01 December, 2008 | Supplied by: IDM Instruments
Designed with dual testing capabilities, the Universal Testing Machine enables compression testing in the centre of the machine and tensile testing on the outer.
Pyranometer calibration
01 December, 2008 | Supplied by: Ecotech Pty Ltd
Ecotech has extended its NATA accredited services to include calibrations of pyranometers.
Small sample AFM/SPM
01 December, 2008 | Supplied by: The Innovation Group Pty Ltd
Asylum Research’s Cypher AFM achieves closed loop atomic resolution using sensors in all three axes, combining the accuracy of closed loop with the power of atomic resolution for accurate images and measurements.
Coating thickness gauge
01 December, 2008 | Supplied by: SI Instruments
ElektroPhysik has released the MiniTest 700 range of digital coating thickness gauges featuring SIDSP technology.
Thickness gauge
01 December, 2008 | Supplied by: IDM Instruments
The Thickness Gauge Digital Indicator with Stand is a small, lightweight instrument that can be used on many different materials. With a 12 mm range, a measuring foot of 5 mm and an accuracy of 0.003 mm, it is suitable for the laboratory or the production line.
Tension and compression tester
01 December, 2008 | Supplied by: SI Instruments
The Mecmesin MultiTest-d test system is available in 1 and 2.5 kN capacities. The tester works in conjunction with a digital force gauge and forms an entry-level motorised test system for evaluating quality control parameters in tension and compression.
Digital microscopy cameras
01 December, 2008 | Supplied by: SciTech Pty Ltd
Diagnostic Instruments Spot digital microscopy cameras provide an easy-to-use, comprehensive camera/software package. They range from colour CMOS cameras for brightfield to high-end, deeply cooled EMCCD cameras for ultra low light fluorescence.
Triple quadrupole LC-MS/MS system
06 November, 2008 | Supplied by: http://www.thermo.com/tsqvantage
Thermo Fisher Scientific's TSQ vantage LC-MS/MS increases sensitivity without increasing noise for better reproducibility, accuracy and precision in quantitative analysis.
Counting hair
03 November, 2008
CSIRO has developed maths-based imaging technology to measure hair on different parts of the human body.
Raman microscope
08 October, 2008 | Supplied by: Thermo Fisher Scientific
The Thermo Scientific DXR Raman microscope is designed to help non-specialist users achieve rapid sampling and analysis of particles, down to one-micron spatial resolution.
Back illuminated EMCCD camera
08 October, 2008 | Supplied by: http://www.scitech.com.au
Andor has available the iXonEM+, a dedicated, compact, truly high-end platform, designed to get the best from electron multiplying CCD (EMCCD) technology.
