Analytical instrumentation

Temperature-controlled nanoparticle characterisation

01 December, 2008 | Supplied by: Particle & Surface Sciences Pty Ltd

NanoSight has announced additional temperature control capability for its family of instrumentation.


Thickness gauge

01 December, 2008 | Supplied by: IDM Instruments

The Thickness Gauge Digital Indicator with Stand is a small, lightweight instrument that can be used on many different materials. With a 12 mm range, a measuring foot of 5 mm and an accuracy of 0.003 mm, it is suitable for the laboratory or the production line.


Coating thickness gauge

01 December, 2008 | Supplied by: SI Instruments

ElektroPhysik has released the MiniTest 700 range of digital coating thickness gauges featuring SIDSP technology.


Tension and compression tester

01 December, 2008 | Supplied by: SI Instruments

The Mecmesin MultiTest-d test system is available in 1 and 2.5 kN capacities. The tester works in conjunction with a digital force gauge and forms an entry-level motorised test system for evaluating quality control parameters in tension and compression.


Photo diode array for LC systems

01 December, 2008 | Supplied by: PerkinElmer (Australia) Pty Ltd

The Series 275 HRes photo diode array is designed to accelerate productivity and performance for laboratories performing LC analysis. Coupled into a Series 275 HRes LC system, the product is claimed to provide improved peak identification and peak purity determination in addition to increased throughput.


X-ray diffractometer

01 December, 2008 | Supplied by: Varian Australia Pty Ltd

The SuperNova dual wavelength X-ray diffractometer from Oxford Diffraction is designed for the analysis of small molecules and proteins. The instrument uses high-intensity micro-source X-ray technology to determine the structure of small molecules and proteins at high resolution.


Aerosol backscatter analysis

01 December, 2008 | Supplied by: Ecotech Pty Ltd

The Aurora nephelometer is designed for use in backscatter global warming studies. It allows the analysis of aerosols by measuring their backscattering effect on light.


Non-contact measuring system

01 December, 2008 | Supplied by: Testequip Pty Ltd

The Kestrel from Vision Engineering is an easy-to-use, 2-axis non-contact measurement and inspection system that provides measurement accuracy and repeatability. The non-contact method provides a solution to accurately gauge precision-machined parts, like aerospace components, without deforming them.


Triple quadrupole LC-MS/MS system

06 November, 2008 | Supplied by: http://www.thermo.com/tsqvantage

Thermo Fisher Scientific's TSQ vantage LC-MS/MS increases sensitivity without increasing noise for better reproducibility, accuracy and precision in quantitative analysis.


Counting hair

03 November, 2008

CSIRO has developed maths-based imaging technology to measure hair on different parts of the human body.


Raman microscope

08 October, 2008 | Supplied by: Thermo Fisher Scientific

The Thermo Scientific DXR Raman microscope is designed to help non-specialist users achieve rapid sampling and analysis of particles, down to one-micron spatial resolution.


Back illuminated EMCCD camera

08 October, 2008 | Supplied by: http://www.scitech.com.au

Andor has available the iXonEM+, a dedicated, compact, truly high-end platform, designed to get the best from electron multiplying CCD (EMCCD) technology.


New equipment for Monash’s Protein Crystallography Unit

26 September, 2008

Monash University's Protein Crystallography Unit is being upgraded with a new automated protein crystallisation system, an imaging plate dectector and an HF X-ray source.


Imaging microscope

03 September, 2008 | Supplied by: Thermo Fisher Scientific

The Thermo Fisher Scientific Nicolet iN10 MX infrared imaging microscope enables analysts to quickly determine the identity and distribution of chemical species within complex structures and random mixtures on a microscopic scale.


Bio atomic force microscope

03 September, 2008 | Supplied by: http://www.scitech.com.au

The JPK NanoWizard II atomic force microscope (AFM) is designed to maximise stability, performance, ease of handling with samples in fluid and for full integration with optical microscopy.


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